激光等离子体诊断用Wolter型X射线显微镜的设计

李亚冉; 谢青; 陈志强; 忻秋琪; 穆宝忠

doi:10.11884/HPLPB201830.170440

激光等离子体诊断用Wolter型X射线显微镜的设计

doi: 10.11884/HPLPB201830.170440

李亚冉^{1, 2,},
谢青^{1, 2},
陈志强^{1, 2},
忻秋琪^{1, 2},
穆宝忠^{1, 2, ,}

1.
同济大学教育部先进微结构材料重点实验室, 上海 200092
2.
同济大学物理科学与工程学院, 上海 200092

基金项目:

国家重点研发计划 2017YFA0403300

详细信息

作者简介:
李亚冉(1990—), 男，博士研究生，主要从事X射线成像研究；yrli203@tongji.edu.cn

通讯作者:
穆宝忠(1975—), 男，教授，主要从事X射线光学系统研究；mubz@tongji.edu.cn

中图分类号: O434.1
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- 被引次数: 0
出版历程
- 收稿日期: 2017-11-02
- 修回日期: 2018-03-01
- 刊出日期: 2018-06-15

Optical design of Wolter X-ray microscope for laser plasma diagnostics

Li Yaran^{1, 2
,},
Xie Qing^{1, 2},
Chen Zhiqiang^{1, 2},
Xin Qiuqi^{1, 2},
Mu Baozhong^{1, 2
, ,}

1.
Key Laboratory of Advanced Micro-structured Materials, Ministry of Education, Tongji University, Shanghai 200092, China
2.
School of Physics Science and Engineering, Tongji University, Shanghai 200092, China

摘要

摘要: 围绕着稠密等离子体硬X射线成像诊断，提出了一种基于阿贝正弦条件的Wolter型X射线显微镜的光学系统设计。详细介绍了Wolter显微镜的结构特点和设计方法，进行了参数优化，定量分析了包括物距、放大倍数、掠入射角和双曲面镜镜长在内的初始结构参数对物镜性能的影响。由光线追迹可以得出，在约±260 μm的视场范围内分辨率优于1 μm；在±460 μm范围内优于3 μm。有效视场可达约1 mm，几何集光立体角约为6.1×10^-5sr。同时，该系统具备平响应系统特性，在mm级的视场范围内，系统响应效率的一致性优于93.7%。
- Wolter显微镜 /
- X射线显微术 /
- 等离子体诊断 /
- 激光惯性约束聚变 /
- Rayleigh-Taylor不稳定性
Abstract: Based on the urgent need of conducting imaging diagnostics of dense laser-produced plasma, we present the optical system design of Wolter type X-ray microscope based on Abbe's sine condition. This paper details the structural features and optical design approaches of Wolter microscope. The impacts of initial structure parameters including the object distance, magnification, grazing angle and mirror length of hyperbolic mirror on objective performance are studied quantitatively. According to ray-tracing simulation, the spatial resolution is better than 1 μm in a range of ±260 μm and better than 3 μm in a range of ±460 μm. The effective field of view is estimated as about 1 mm in diameter with a geometric solid angle of 6.1×10^-5 sr. The system is flat-response with an efficiency consistency of 93.7% over the field of view. This paper contributes to the development of high-resolution and high-flux hard X-ray imaging diagnostic instruments in the future.
- Wolter microscope /
- X-ray microscopy /
- plasma diagnostics /
- ICF /
- Rayleigh-Taylor instabilities

HTML全文

图 1 子午面内Wolter显微镜的光学结构示意图

Figure 1. Optical structure of Wolter X-ray microscope in meridian plane

下载: 全尺寸图片幻灯片

图 2 初始结构参数对Wolter显微镜性能的影响

Figure 2. Impacts of initial structure parameters on Wolter optical performance

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图 3 Wolter显微镜的反射镜尺寸及面形

Figure 3. Dimension figure and surface contour of Wolter reflecting mirrors

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图 4 位置偏差对空间分辨率的影响

Figure 4. Impacts of positioning errors on spatial resolution

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图 5 系统响应效率随能量和物方视场的变化

Figure 5. System response efficiency as a function of photon energy and field of view

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图 6 不同角度大小的Wolter扇区对系统分辨率和效率的影响

Figure 6. Impacts of different mirror sections on system performance

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表 1 Wolter型X射线显微镜的光学结构参数

Table 1. Optical parameters of Wolter X-ray microscope

contour	object distance/mm	grazing angle/(°)	a/mm	b/mm	mirror length/mm	front-end radius/mm	back-end radius/mm
hyperboloid	292.4	0.408	165.8	3.0	15.0	7.686	7.981
ellipsoid	307.8	0.398	3315.9	13.6	15.8	7.981	8.069

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参考文献(16)

[1]	Li Y, Mu B, Xie Q, et al. Development of an X-ray eight-image Kirkpatrick-Baez diagnostic system for China's laser fusion facility[J]. Appl Opt, 2017, 56(12): 3311-3318. doi: 10.1364/AO.56.003311
[2]	Xie Q, Mu B, Li Y, et al. Development of high resolution dual-energy KBA microscope with large field of view for RT-instability diagnostics at SG-Ⅲ facility[J]. Opt Express, 2017, 25(3): 2608-2617. doi: 10.1364/OE.25.002608
[3]	穆宝忠, 伊圣振, 黄圣铃, 等. ICF用Kirkpatrick-Baez型显微镜光学设计[J]. 强激光与粒子束, 2008, 20(3): 409-412. http://www.hplpb.com.cn/article/id/3249 Mu Baozhong, Yi Shengzhen, Huang Shengling, et al. Optical design of Kirkpatrick-Baez microscope for ICF. High Power Laser and Particle Beams, 2008, 20(3): 409-412 http://www.hplpb.com.cn/article/id/3249
[4]	Wolter H. Spiegelsysteme streifenden Einfalls als abbildende Optiken für Röntgenstrahlen[J]. Ann Phys, 1952, 445(1/2): 94-114.
[5]	王风丽, 王占山, 张众, 等. X射线天文望远镜的进展[J]. 物理, 2005, 34(3): 214-220. doi: 10.3321/j.issn:0379-4148.2005.03.013 Wang Fengli, Wang Zhanshan, Zhang Zhong, et al. The development of X-ray astronomical telescopes. Physics, 2005, 34(3): 214-220 doi: 10.3321/j.issn:0379-4148.2005.03.013
[6]	Chase R C, Silk J K. Ellipsoid-hyperboloid X-ray imaging instrument for laser-pellet diagnostics[J]. Appl Opt, 1975, 14(9): 2096-2098. doi: 10.1364/AO.14.002096
[7]	Boyle M J, Ahlstrom H G. Imaging characteristics of an axisymmetric, grazing incidence X-ray microscope designed for laser fusion research[J]. Rev Sci Instrum, 1978, 49(6): 746-751. doi: 10.1063/1.1135605
[8]	Remington B A, Haan S W, Glendinning S G, et al. Large growth Rayleigh-Taylor experiments using shaped laser pulses[J]. Phys Rev Lett, 1991, 67(23): 3259-3262. doi: 10.1103/PhysRevLett.67.3259
[9]	Remington B A, Glendinning S G, Wallace R J, et al. Wölter X-ray microscope characterization measurements on Nova[J]. Rev Sci Instrum, 1992, 63(10): 5080-5082. doi: 10.1063/1.1143498
[10]	Remington B A, Weber S V, Marinak M M, et al. Single-mode and multimode Rayleigh-Taylor experiments on Nova[J]. Phys Plasmas, 1995, 2(1): 241-255. doi: 10.1063/1.871096
[11]	Kirkpatrick P, Baez A V. Formation of optical images by X-rays[J]. J Opt Soc Am, 1948, 38(9): 766-774. doi: 10.1364/JOSA.38.000766
[12]	Chon K S, Namba Y, Yoon K. Optimization of a Wolter type Ⅰ mirror for a soft X-ray microscope[J]. Prec Eng, 2006, 30(2): 223-230. doi: 10.1016/j.precisioneng.2005.09.002
[13]	Chon K S, Namba Y, Yoon K H. Precision machining of electroless nickel mandrel and fabrication of replicated mirrors for a soft X-ray microscope[J]. JSME International Journal Series C, 2006, 49(1): 56-62. doi: 10.1299/jsmec.49.56
[14]	Ninomiya K, Honda K, Aoki S, et al. Fabrication of an axisymmetric wolter type Ⅰ mirror with a gold deposited reflecting surface[J]. Jpn J Appl Phys, 1989, 28(11): 2303-2308.
[15]	Yamauchi K, Mimura H, Inagaki K, et al. Figuring with subnanometer-level accuracy by numerically controlled elastic emission machining[J]. Rev Sci Instrum, 2002, 73(11): 4028-4033. doi: 10.1063/1.1510573
[16]	Mori Y, Yamauchi K, Endo K. Mechanism of atomic removal in elastic emission machining[J]. Prec Eng, 1988, 10(1): 24-28. doi: 10.1016/0141-6359(88)90091-8