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真空紫外辐照对交联乙烯-四氟乙烯线缆的影响

张海明 张义 贾晓 王凯 陶兆增 沈世钊 王海玉

张海明, 张义, 贾晓, 等. 真空紫外辐照对交联乙烯-四氟乙烯线缆的影响[J]. 强激光与粒子束. doi: 10.11884/HPLPB202234.220021
引用本文: 张海明, 张义, 贾晓, 等. 真空紫外辐照对交联乙烯-四氟乙烯线缆的影响[J]. 强激光与粒子束. doi: 10.11884/HPLPB202234.220021
Zhang Haiming, Zhang Yi, Jia Xiao, et al. Effect of vacuum ultraviolet radiation on X-ETFE cable[J]. High Power Laser and Particle Beams. doi: 10.11884/HPLPB202234.220021
Citation: Zhang Haiming, Zhang Yi, Jia Xiao, et al. Effect of vacuum ultraviolet radiation on X-ETFE cable[J]. High Power Laser and Particle Beams. doi: 10.11884/HPLPB202234.220021

真空紫外辐照对交联乙烯-四氟乙烯线缆的影响

doi: 10.11884/HPLPB202234.220021
基金项目: 国家质量工程项目(2019WR0008)
详细信息
    作者简介:

    张海明,zy_pb@163.com

  • 中图分类号: TM215.3

Effect of vacuum ultraviolet radiation on X-ETFE cable

  • 摘要: 以航天器舱外用交联乙烯-四氟乙烯共聚物(X-ETFE)线缆为试验对象,采用5倍加速因子对X-ETFE线缆累计进行了8000等效太阳小时(ESH)真空紫外(VUV)辐照,并通过极限耐电压、绝缘材料电阻测试分析X-ETFE线缆电性能,采用FTIR和SEM表征X-ETFE材料分子结构和微观形貌,以此研究不同VUV辐照时间对X-ETFE线缆的影响。试验结果表明,随着VUV辐照时间的增加,材料表面累积了碳而发生暗化,线缆外观颜色逐渐变为深棕色;X-ETFE线缆的极限耐压和绝缘电阻呈总体下降趋势,但整体电性能水平未发生本质变化; X-ETFE材料在1628 cm−1处的吸收峰逐步增大,说明X-ETFE材料分子链中的−C=C−自由基团随辐照时间而增多,致使材料表面出现了微裂纹现象。
  • 图  1  VUV辐照试验设备

    Figure  1.  VUV radiating test equipment

    图  2  VUV辐照时间对外观颜色的影响

    Figure  2.  VUV radiation time on appearance color of X-ETFE cable

    图  3  X-ETFE线缆VUV辐照时间与极限耐电压关系曲线

    Figure  3.  Relationship between X-ETFE cable VUV radiation time and ultimate withstand voltage

    图  4  VUV辐照时间对绝缘电阻的影响

    Figure  4.  Influence of VUV radiation time on insulation resistance

    图  5  不同VUV辐照时间X-ETFE线缆绝缘材料红外光谱

    Figure  5.  FTIR of X-ETFE cable insulation materials with different VUV radiation time

    图  6  不同VUV辐照时间X-ETFE线缆表面的形貌

    Figure  6.  Surface morphology of the X-ETFE cable with different VUV radiation time

    表  1  实验样品表

    Table  1.   Test samples

    No.VUV irradiation time/hlength of sample/m
    1# 0 2
    2# 100 2
    3# 500 2
    4# 1000 2
    5# 2000 2
    6# 4000 2
    7# 8000 2
    下载: 导出CSV

    表  2  VUV辐照设备参数指标

    Table  2.   VUV radiating test equipment parameter

    projectmain indicatorsparameter
    near UVlight sourcexenon lamp
    spectrum200 nm~400 nm
    irradiation areamaximum Φ150 mm
    irradiance1353 W/m2~6765 W/m2
    inhomogeneous irradiationbetter than ±5%
    irradiation stability±3%
    far UVlight sourcedeuterium lamp (150 W)
    spectrum115 nm~200 nm
    irradiation areanot less than Φ150 mm
    irradiancemaximum 27060 W/m2
    othertemperature control range of sample+10 ℃~+50 ℃
    temperature of heat sinknot higher than −25 ℃
    vessel vacuumno load at room temperature is better than 3×10−3 Pa
    下载: 导出CSV

    表  3  不同VUV辐照时间后X-ETFE线缆极限电压值

    Table  3.   Limiting voltage of X-ETFE cable after different VUV radiation time

    VUV radiation time/hwithstand limit voltage/kVtest result
    028no breakdown
    10022breakdown
    50022breakdown
    100018.5breakdown
    200018breakdown
    400017breakdown
    800015.5breakdown
    下载: 导出CSV

    表  4  不同VUV辐照时间后X-ETFE线缆绝缘电阻值

    Table  4.   Insulation resistance of X-ETFE cable after VUV radiation of different time

    VUV radiation time/hinsulation resistance/(MΩ·km)
    012000
    1009900
    50010000
    100010000
    20009900
    400010000
    80007840
    下载: 导出CSV
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  • 收稿日期:  2022-01-12
  • 修回日期:  2022-05-27
  • 网络出版日期:  2022-06-11

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