真空紫外辐照对交联乙烯-四氟乙烯线缆的影响

张海明; 张义; 贾晓; 王凯; 陶兆增; 沈世钊; 王海玉

doi:10.11884/HPLPB202234.220021

真空紫外辐照对交联乙烯-四氟乙烯线缆的影响

doi: 10.11884/HPLPB202234.220021

1.
中国航天宇航元器件工程中心，北京 100029
2.
中国电子科技集团公司第二十三研究所，上海 201900

基金项目: 国家质量工程项目（2019WR0008）

详细信息

作者简介:
张海明，zy_pb@163.com

中图分类号: TM215.3
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- 被引次数: 0
出版历程
- 收稿日期: 2022-01-12
- 修回日期: 2022-05-27
- 网络出版日期: 2022-06-11
- 刊出日期: 2022-09-20

Effect of vacuum ultraviolet radiation on X-ETFE cable

1.
Components Engineering Center, China Aerospace, Beijing 100029, China
2.
The 23rd Research Institute, CETC, Shanghai 201900, China

摘要

摘要: 以航天器舱外用交联乙烯-四氟乙烯共聚物(X-ETFE)线缆为试验对象，采用5倍加速因子对X-ETFE线缆累计进行了8000等效太阳小时(ESH)真空紫外(VUV)辐照，并通过极限耐电压、绝缘材料电阻测试分析X-ETFE线缆电性能，采用FTIR和SEM表征X-ETFE材料分子结构和微观形貌，以此研究不同VUV辐照时间对X-ETFE线缆的影响。试验结果表明，随着VUV辐照时间的增加，材料表面累积了碳而发生暗化，线缆外观颜色逐渐变为深棕色；X-ETFE线缆的极限耐压和绝缘电阻呈总体下降趋势，但整体电性能水平未发生本质变化； X-ETFE材料在1628 cm⁻¹处的吸收峰逐步增大，说明X-ETFE材料分子链中的−C=C−自由基团随辐照时间而增多，致使材料表面出现了微裂纹现象。
- 交联乙烯-四氟乙烯线缆 /
- 真空紫外辐照 /
- 极限耐电压 /
- 绝缘电阻 /
- 微观结构
Abstract: Taking the cross-linked ethylene tetrafluoroethylene copolymer (X-ETFE) cable used outside the spacecraft as the test object, the X-ETFE cable was irradiated with 8000 equivalent solar hours (ESH) vacuum ultraviolet (VUV) with a 5-fold acceleration factor. The electrical properties of the X-ETFE cable were analyzed through the limit voltage resistance and insulation material resistance tests. The molecular structure and micro morphology of the X-ETFE material were characterized by FTIR and SEM, The effects of different VUV irradiation time on X-ETFE cable have been studied.. The experimental results show that with the increase of VUV irradiation time, carbon accumulates on the material surface and darkens, and the appearance color of the cable gradually changes to dark brown; The ultimate withstand voltage and insulation resistance of X-ETFE cable show an overall downward trend, but the overall electrical performance level has no substantial change; The absorption peak of X-ETFE material at 1628 cm⁻¹ gradually increases, indicating that the −C=C− free group in the molecular chain of X-ETFE material increases with irradiation time, resulting in microcracks on the surface of the material.
- X-ETFE cable /
- VUV radiation /
- ultimate withstand voltage /
- insulation resistance /
- micro structure

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图 1 VUV辐照试验设备

Figure 1. VUV radiating test equipment

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图 2 VUV辐照时间对外观颜色的影响

Figure 2. VUV radiation time on appearance color of X-ETFE cable

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图 3 X-ETFE线缆VUV辐照时间与极限耐电压关系曲线

Figure 3. Relationship between X-ETFE cable VUV radiation time and ultimate withstand voltage

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图 4 VUV辐照时间对绝缘电阻的影响

Figure 4. Influence of VUV radiation time on insulation resistance

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图 5 不同VUV辐照时间X-ETFE线缆绝缘材料红外光谱

Figure 5. FTIR of X-ETFE cable insulation materials with different VUV radiation time

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图 6 不同VUV辐照时间X-ETFE线缆表面的形貌

Figure 6. Surface morphology of the X-ETFE cable with different VUV radiation time

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表 1 实验样品表

Table 1. Test samples

No.	VUV irradiation time/h	length of sample/m
1#	0	2
2#	100	2
3#	500	2
4#	1000	2
5#	2000	2
6#	4000	2
7#	8000	2

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表 2 VUV辐照设备参数指标

Table 2. VUV radiating test equipment parameter

project	main indicators	parameter
near UV	light source	xenon lamp
	spectrum	200 nm～400 nm
	irradiation area	maximum Φ150 mm
	irradiance	1353 W/m²～6765 W/m²
	inhomogeneous irradiation	better than ±5%
	irradiation stability	±3%
far UV	light source	deuterium lamp (150 W)
	spectrum	115 nm～200 nm
	irradiation area	not less than Φ150 mm
	irradiance	maximum 27060 W/m²
other	temperature control range of sample	+10 ℃～+50 ℃
	temperature of heat sink	not higher than −25 ℃
	vessel vacuum	no load at room temperature is better than 3×10⁻³ Pa

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表 3 不同VUV辐照时间后X-ETFE线缆极限电压值

Table 3. Limiting voltage of X-ETFE cable after different VUV radiation time

VUV radiation time/h	withstand limit voltage/kV	test result
0	28	no breakdown
100	22	breakdown
500	22	breakdown
1000	18.5	breakdown
2000	18	breakdown
4000	17	breakdown
8000	15.5	breakdown

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表 4 不同VUV辐照时间后X-ETFE线缆绝缘电阻值

Table 4. Insulation resistance of X-ETFE cable after VUV radiation of different time

VUV radiation time/h	insulation resistance/(MΩ·km)
0	12000
100	9900
500	10000
1000	10000
2000	9900
4000	10000
8000	7840

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